Pyrometallurgy Innovation Centre (PYROSEARCH)

The Centre for Microscopy and Microanalysis has advanced micro-imaging and analysis equipment including JEOL JXA-8200 EPMA, Field Emission High Resolution SEM JEOL 7001s and Philips F20 TEM.

The Probe is equipped with a highly stable SEM, five WD spectrometers and one ED spectrometer for X-ray analysis. It is a very high accuracy analytical instrument with the ability to measure chemical composition of a phase with resolution of a micron scale. Detection limit of 150-300 ppm is possible to achieve with special analysis procedure. Standard References block is mounted permanently in the probe stage making accurate calibration is possible for each measurement session.

  • X-ray spectrum of slag sample
    X-ray spectrum of slag sample
  • EPMA measurement of chemically dissolved copper in slag
    EPMA measurement of chemically dissolved copper in slag. Slag/matte equilibria in the Cu-Fe-O-S-Si chemical system
JEOL JXA-8200 EPMA

JEOL JXA-8200 EPMA